Single-phase κ-Ga2O3 films deposited by metal-organic chemical vapor deposition on GaAs and ternary BxGa(1-x)As templates
• Single-phase κ-Ga 2 O 3 is deposited on p-(B)GaAs/GaAs templates for the first time by MOVPE. • Boron segregation and diffusion can assist κ-Ga 2 O 3 purity phase. • New amorphous layer a-BGaO is formed in κ-Ga 2 O 3 /BGaAs/GaAs. • Columnar growth of orthorhombic κ-phase grains on (B)GaAs/GaAs. • The heterojunction κ-Ga 2 O 3 /III-V can develop new active structures for photodetectors and solar cells. • Structural, interfacial and morphological properties of κ-Ga 2 O 3 /GaAs and κ-Ga 2 O 3 /BGaAs/GaAs. For the first time, single-phase κ-Ga 2 O 3 films were grown on (001) p-type GaAs and B x Ga (1-x) As /GaAs templates using Metal-Organic Chemical Vapor Deposition (MOCVD). The films were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). TEM investigations revealed a thin polycrystalline nucleation layer followed by well-oriented columnar growth of the κ-phase in the Ga 2 O 3 /GaAs sample, while segregation and diffusion effects in the ternary alloy led to boron accumulation on the template surface, which reacted with oxygen during the first stage of Ga 2 O 3 deposition to form a thin amorphous oxide ( a -BGaO) at the interface between Ga 2 O 3 and the BGaAs/GaAs template. Again, columnar growth of large [001]-oriented grains of the orthorhombic κ-phase occurred on the amorphous nucleation layers, which resulted in a compact gallium oxide film. These polycrystalline or amorphous interlayers are important as they provide a suitable platform for growth of phase-pure orthorhombic κ-Ga 2 O 3 on III-V cubic substrates. This work paves the way to the integration of κ-Ga 2 O 3 and III-V semiconductors, for preparing heterojunctions for novel electronic and optoelectronic devices.
Authors
- Tarek Hidouri (ORCID: https://orcid.org/0000-0002-4717-5014)
- R. Fornari (ORCID: https://orcid.org/0000-0002-4499-8015)
- Philippe Rodriguez (ORCID: https://orcid.org/0000-0003-0865-5944)
- C. Ferrari (ORCID: https://orcid.org/0000-0002-9355-1834)
- Andrea Pedrielli (ORCID: https://orcid.org/0000-0002-8322-8259)
- L. Seravalli (ORCID: https://orcid.org/0000-0003-2784-1785)
- Matteo Bosi (ORCID: https://orcid.org/0000-0001-8992-0249)
- Elena Ferrari (ORCID: https://orcid.org/0000-0001-5525-8525)
- L. Nasi (ORCID: https://orcid.org/0000-0002-1663-1558)
Institutions
- University of Parma (IT)
- Fondazione Bruno Kessler (IT)
- Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR)
- CEA Grenoble (FR)
- Institute of Materials for Electronics and Magnetism (IT)
- Direction de la Recherche Technologique (FR)
- Laboratoire d'Électronique des Technologies de l'Information (FR)
- Université Grenoble Alpes (FR)
Publication Details
- Journal
- Applied Surface Science
- Published
- 2025-06-07
- DOI
- https://doi.org/10.1016/j.apsusc.2025.163764
- Citations
- 4
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 1.71