Single-pulse in-line holography for ultrafast imaging of extended objects with 10nm resolution

For nanoscale X-ray imaging, scanning-based techniques are commonly used but are often limited by the slow speed of sample scanning. Scanless, single-shot imaging provides a promising approach to drastically reduce acquisition time. In particular, combining this approach with X-ray free-electron lasers (XFELs) enables ultrafast imaging on a femtosecond timescale. However, achieving both a wide field-of-view and high spatial resolution in single-pulse XFEL imaging remains a significant challenge. In this study, we aim to develop a single-pulse XFEL in-line holography technique capable of fullfield imaging with a field-of-view exceeding 1μm and spatial resolution of 10 nm. Our method combined two key approaches: high numerical aperture mirror optics and an algorithm to compensate for fluctuations in illumination caused by the stochastic nature of the self-amplified spontaneous emission (SASE) process. This single-shot, full-field, highresolution imaging technique provides a new strategy to fully exploit the brilliance of future X-ray sources for advanced imaging applications.