Compact laser-induced plasma source for advanced soft X-ray absorption spectroscopy

X-ray absorption spectroscopy is a key method for compositional analysis, probing electronic transitions from core to unoccupied states. Traditionally, this technique requires large-scale facilities like synchrotrons due to the high photon flux needed, especially in the soft X-ray range. Recent developments in table-top soft X-ray sources now offer a laboratory-scale alternative. We present our compact, pulsed gas-target laser-induced plasma source using a krypton jet, producing debris-free radiation from 250 to 1000 eV. Integrated with a high line-density flat-field grating, our spectrometer achieves a resolution of up to E/ΔE = 1535 at 430 eV, allowing multi-edge analysis. This system effectively resolves K- and L-edges of various elements and supports both solid and liquid thin samples. Using a thin lamella in vacuum for liquid samples expands analysis capabilities. Excellent synchrotron comparison highlights this system’s potential as an accessible alternative for routine, high-precision measurements.