Sample cell for in-situ measurements of ferroelectric polarization and diffraction at beamline P24, DESY

Abstract In-situ measurements of ferroelectric polarization and diffraction under an applied electric field are critical for establishing accurate structure-property correlation. This method captures the dynamic response of ferroelectric materials. To address the challenge of measuring ferroelectric polarization and diffraction data, an in-situ cell equipped with the necessary electronics is developed at the P24 chemical crystallography beamline. Designed sample cell is suitable for measuring ferroelectric polarization and synchrotron X-ray diffraction under an applied electric field for plate shaped crystals. To have temperature control, cartridge heater, peltier element and heat sink are installed and one can perform the experiments in the temperature range of 240K to 420K. The sample cell has been tested with single crystals of KTa 0 . 67 Nb 0 . 33 NO 3 (KTN), K 0 . 95 Li 0 . 05 Ta 0 . 73 Nb 0 . 27 NO 3 (Li doped KTN) and BaTiO 3 (BTO).