Implementation of the quick-scanning EXAFS technique at DELTA beamline 10

Abstract The quick-scanning EXAFS technique has been implemented at the materials science beamline 10 at the DELTA storage ring. The experiments have shown that high-quality EXAFS data can be achieved on time scales of slightly more than 30 seconds for a high-quality EXAFS scan extending over 1500 eV and more, while near edge XANES data covering about 100 eV only take 1-2 seconds. The new experimental capabilities allow extended scans of multi-element samples such as high-entropy-alloys encompassing several absorption edges within some few minutes acquisition time, and dynamical processes with a characteristic time scale of some seconds may be investigated with XANES. We will describe the experimental set-up, discuss collected data and give an outline for future experiments.