Nano X-ray Tomography at the CARNAÚBA Beamline (SIRIUS-LNLS) in diamond mineral inclusions
Abstract The CARNAÚBA beamline is an X-ray nanoprobe that enables nanoscale tomography by scanning a beam smaller than 500 nm. It features a high flux (10 9 to 10 10 ph/s/100 mA at 12 keV) and simultaneous acquisition of transmission and fluorescence data, through a photodiode and two fluorescence detectors, respectively, allowing the mapping of various elements and facilitating 3D images with multiple contrasts. This technique was applied to analyze two distinct minerals trapped in a diamond. Tomography measurements required precise alignment of the inclusions at different rotation angles, conducted at 12 keV over a scanned area of 100x100 µm 2 . The experiment itself involved 7 hours of data acquisition over a scanned area of 80x80 µm 2 , resulting in voxel sizes of 0.8x0.8x0.8 µm 3 . Data reconstruction was performed using a modified version of Chang’s method for fluorescence data, incorporating µ-Tomography reconstruction to address diamond-related self-absorption effects. This technique allowed us to identify different types of geological features. We present here the case of two mineral inclusions in the same diamond.
Authors
- Francisco M. C. da Silva (ORCID: https://orcid.org/0000-0002-7054-2265)
- Paola Ferraz (ORCID: https://orcid.org/0000-0002-1457-705X)
- Tiago Jalowitzki (ORCID: https://orcid.org/0000-0001-9857-7876)
- Fernanda Gervasoni (ORCID: https://orcid.org/0000-0002-9533-4008)
- Antônio Pinto do Nascimento Neto (ORCID: https://orcid.org/0000-0002-2089-1184)
- H. Tolentino (ORCID: https://orcid.org/0000-0003-4025-8893)
- Eduardo X. Miqueles (ORCID: https://orcid.org/0000-0001-6576-4288)
- Carolina Camarda (ORCID: https://orcid.org/0000-0002-1702-9817)
- João Oliveira (ORCID: https://orcid.org/0000-0002-7465-1469)
Institutions
- Universidade de Brasília (BR)
- Universidade Federal de Pelotas (BR)
- Brazilian Synchrotron Light Laboratory (BR)
- Brazilian Center for Research in Energy and Materials (BR)
- European X-Ray Free-Electron Laser (DE)
Publication Details
- Journal
- Journal of Physics Conference Series
- Published
- 2025-05-01
- DOI
- https://doi.org/10.1088/1742-6596/3010/1/012178
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00