Toward high-speed and high-accuracy single crystal X-ray diffraction measurements using the integration-type detector CITIUS

Abstract The integration-type two-dimensional detector CITIUS has a high saturation count rate, capable of measurements up to 600 Mcps/pixel (at 12.4 keV and a frame rate of 17.4 kHz). Aiming to integrate the CITIUS detector for X-ray diffraction measurements at undulator beamlines, we conducted proof-of-concept experiments at SPring-8 BL29XU using 30 keV X-rays and a ruby single-crystal standard sample. The goal of integrating CITIUS is to obtain data at high speed and accuracy, which is critical for precise single-crystal X-ray structural analyses. The experimental results confirmed that CITIUS is applicable to single-crystal diffraction experiments using 30 keV X-rays. We observed that peak intensities can be measured at least 0.9 Mcps/pixel (at a frame rate of 1 kHz), corresponding to 15.7 Mcps/pixel at a 17.4 kHz frame rate. Several challenges were also identified. Developments are ongoing to solve these issues.