Cryo-cooled silicon monochromators at the Materials Imaging and Dynamics (MID) instrument of the European XFEL
Abstract Monochromatization and diagnostics of SASE spectral properties over the entire hard X-ray range are important for many experiments utilizing transverse and longitudinal coherence of XFEL beam. For this purpose the Materials Imaging and Dynamics instrument at European XFEL is equipped with two cryo-cooled double-crystal monochromators using Si111 and Si220 optics. Optical parameters, design and performance of both monochromators are presented.
Authors
- Wonhyuk Jo (ORCID: https://orcid.org/0000-0002-7437-6129)
- J. Eidam
- Jörg Hallmann (ORCID: https://orcid.org/0000-0002-1996-397X)
- Roman Shayduk (ORCID: https://orcid.org/0000-0002-3577-8918)
- Harald Sinn (ORCID: https://orcid.org/0000-0001-7546-1870)
- Liubov Samoylova
- Anders Madsen (ORCID: https://orcid.org/0000-0001-6594-1029)
- Jan‐Etienne Pudell (ORCID: https://orcid.org/0000-0001-8268-444X)
- Johannes Möller (ORCID: https://orcid.org/0000-0001-8363-9077)
- M. Dommach
- Alexey V. Zozulya (ORCID: https://orcid.org/0000-0003-1048-3432)
- Angel Rodríguez-Fernández (ORCID: https://orcid.org/0000-0003-0587-5263)
- Maurizio Vannoni (ORCID: https://orcid.org/0000-0002-2768-4559)
- Ulrike Bösenberg
- Thomas Roth (ORCID: https://orcid.org/0000-0003-4937-1067)
- D. Shu (ORCID: https://orcid.org/0009-0003-1499-1300)
Institutions
- Argonne National Laboratory (US)
- European Synchrotron Radiation Facility (FR)
- European X-Ray Free-Electron Laser (DE)
Publication Details
- Journal
- Journal of Physics Conference Series
- Published
- 2025-05-01
- DOI
- https://doi.org/10.1088/1742-6596/3010/1/012057
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00