Construction of a beamline-crossing sample transfer system for surface science

Abstract In order to understand the various functions and properties emerging at surfaces and interfaces of thin films, it is insufficient to evaluate them using a single method, but a comprehensive analysis should be performed by combining multiple probes and methods. We have been developing the beamline-crossing sample transfer system that enables the sample transfer from a sample preparation chamber to an analysis device and between multiple end stations preventing the degradation of the sample surface due to air exposure. To realize this system, we performed the standardization of the holder shape at end stations for surface science and the installation of a sample transfer vessel. The results of photoemission measurements on SnO thin films, which are easily degraded (oxidized) in air, indicate the effectiveness of the developed system for surface analysis.