The meV-resolved Inelastic X-ray Scattering Beamline at NSLS-II: Design and Performance

Abstract The ultrahigh resolution inelastic X-ray scattering (IXS) beamline at NSLS-II is designed and built to achieve sub-meV resolution at a moderate energy of 9.13 keV for IXS experiments with high momentum resolution and high spectral contrast. The key instrument is a novel spectrometer featuring a new type of analyzer optics, which combines post-sample collimation with angular dispersive crystal optics. As the first user instrument of its kind, the spectrometer has demonstrated unique research capabilities in exploring low momentum transfer ( Q ), THz dynamics in soft material systems characterized by mesoscopic heterogeneity and complexity, such as liquid crystals and bio-membranes. Ongoing efforts to improve performance since the start of user operations have resulted in a state-of-the-art energy resolution in routine operations of less than 1.4 meV, with sharp Gaussian-like tails, making it a premier IXS spectrometer for studying the dynamics of soft materials, while also delivering competitive performance for investigating phonon dynamics in hard condensed matter systems, including a broad range of quantum materials.