Single-shot temporal characterization with the transverse deflecting structure PolariX and THz streaking at FLASH

Abstract At the free electron laser FLASH at DESY pulse length measurements can be performed with e.g. THz streaking or an analysis using the PolariX TDS. Since THz streaking examines the XUV pulse directly whereas the PolariX TDS focuses on the energy distribution of the (XUV pulse generating) electron bunch, both techniques are capable of analyzing the same XUV pulse simultaneously. We used a newly installed laser heater to shape the electron bunch and therefore influence the XUV pulse profile and compare the resulting pulse shapes measured by THz streaking and the PolariX TDS. We compare average pulse profiles as well as single-shot examples and discuss the challenges of both types of analysis.