Speckle analysis as a characterization tool for the focusing properties of diamond X-ray lenses

Abstract The availability of intense X-ray beams at megahertz repetition rate allows for new scattering and imaging experiments using the unique pulse train structure of the European X-ray Free-Electron Laser (EuXFEL). However, the resulting heat load can pose challenges for X-ray optics and potentially limit the efficiency. In this context, X-ray optics made of diamond emerge as a promising solution better suited for the extreme beam conditions at EuXFEL. In this article, we demonstrate a simple speckle analysis to determine the size of the focused beam in a caustic scan. The lenses are 1D planar diamond lenses and experiments were performed at the Materials Imaging and Dynamics (MID) station of EuXFEL. We find a minimum beam size of 630 nm and compare the speckle method with the more conventional method of wire scanning.

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Publication Details

Journal
Journal of Physics Conference Series
Published
2025-05-01
DOI
https://doi.org/10.1088/1742-6596/3010/1/012104
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Speckle analysis as a characterization tool for the focusing properties of diamond X-ray lenses

Wonhyuk Jo, Jörg Hallmann, Christian G. Schroer, Magdy M. Youssef et al.
Journal of Physics Conference Series
Advanced X-ray Imaging Techniques
article

Speckle analysis as a characterization tool for the focusing properties of diamond X-ray lenses

Wonhyuk Jo, Jörg Hallmann, Christian G. Schroer, Magdy M. Youssef, Mikako Makita, Anders Madsen, Jan‐Etienne Pudell, Johannes Möller, Mikhail Lyubomirskiy, Alexey V. Zozulya, Frank Seiboth, G. Ansaldi, Wei Wang
article en

Abstract

Abstract The availability of intense X-ray beams at megahertz repetition rate allows for new scattering and imaging experiments using the unique pulse train structure of the European X-ray Free-Electron Laser (EuXFEL). However, the resulting heat load can pose challenges for X-ray optics and potentially limit the efficiency. In this context, X-ray optics made of diamond emerge as a promising solution better suited for the extreme beam conditions at EuXFEL. In this article, we demonstrate a simple speckle analysis to determine the size of the focused beam in a caustic scan. The lenses are 1D planar diamond lenses and experiments were performed at the Materials Imaging and Dynamics (MID) station of EuXFEL. We find a minimum beam size of 630 nm and compare the speckle method with the more conventional method of wire scanning.

Journal of Physics Conference SeriesVol. 3010(1)
Universität Hamburg (DE), Deutsches Elektronen-Synchrotron DESY (DE), European X-Ray Free-Electron Laser (DE)
Openalex Percentile: Top 82%
Advanced X-ray Imaging Techniques
DOIOpen Access PDFOpenAlex
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Speckle analysis as a characterization tool for the focusing properties of diamond X-ray lenses — Wonhyuk Jo, Jörg Hallmann, et al. · Journal of Physics Conference Series (2025) | TGRS Research Map | TGRS