Enhanced Fault Diagnosis Framework by Critical Time Data Capture

The fault diagnosis framework is enhanced to guarantee the capture of signal waveform at the critical time. We demonstrate the identification and localization of sub-microsecond fault induced by OTDR.

Authors

Zhiping Jiang (ORCID: https://orcid.org/0000-0003-3711-870X)
Junho Chang
Choloong Hahn (ORCID: https://orcid.org/0000-0003-3213-345X)
Qing-Yi Guo (ORCID: https://orcid.org/0009-0002-2284-9681)

Institutions

Huawei Technologies (Canada) (CA)

Publication Details

Published: 2025-01-01
DOI: https://doi.org/10.1364/ofc.2025.w3e.2
Citations: 2
Primary Topic: Fault Detection and Control Systems
Type: article
Field-Weighted Citation Impact: 2.43

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article

Enhanced Fault Diagnosis Framework by Critical Time Data Capture

Zhiping Jiang, Junho Chang, Choloong Hahn, Qing-Yi Guo

Jan 1, 2025

2 citations

Fault Detection and Control Systems

2.43

article

Enhanced Fault Diagnosis Framework by Critical Time Data Capture

Zhiping Jiang, Junho Chang, Choloong Hahn, Qing-Yi Guo

January 1, 2025article en

2 citations

Abstract

Huawei Technologies (Canada) (CA)

Openalex Percentile: Top 11%

Fault Detection and Control Systems

2.43

DOI Source OpenAlex

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Enhanced Fault Diagnosis Framework by Critical Time Data Capture — Zhiping Jiang, Junho Chang, et al. · (2025) | TGRS Research Map | TGRS