Compendium of TID and SEE Data on Discrete Flip-Flop and Logic Gate Devices

This paper presents a compendium of Total Ionizing Dose (TID) and Single Event Effects (SEE) test data gathered on several references of logic components: D-type flip-flops (DFFs), configurable logic gates (CLGs) and NAND gates.

Authors

P. Köhler (ORCID: https://orcid.org/0000-0003-4887-3698)
Pierre-Xiao Wang
Alexandre Bosser (ORCID: https://orcid.org/0000-0002-0764-9051)
A. Sellaï

Publication Details

Published: 2024-09-19
DOI: https://doi.org/10.1109/radecs61975.2024.11017537
Primary Topic: Advancements in Semiconductor Devices and Circuit Design
Type: article
Field-Weighted Citation Impact: 0.00

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article

Compendium of TID and SEE Data on Discrete Flip-Flop and Logic Gate Devices

P. Köhler, Pierre-Xiao Wang, Alexandre Bosser, A. Sellaï

Sep 19, 2024

Advancements in Semiconductor Devices and Circuit Design

article

Compendium of TID and SEE Data on Discrete Flip-Flop and Logic Gate Devices

P. Köhler, Pierre-Xiao Wang, Alexandre Bosser, A. Sellaï

September 19, 2024article en

Abstract

Openalex Percentile: Top 72%

Advancements in Semiconductor Devices and Circuit Design

DOI Source OpenAlex

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Compendium of TID and SEE Data on Discrete Flip-Flop and Logic Gate Devices — P. Köhler, Pierre-Xiao Wang, et al. · (2024) | TGRS Research Map | TGRS