Application of Wsmx Cards in Sensor Chip Testing and The Resulting Simplification of Test Circuits

This paper introduces the application of the WSMX card in the testing of automotive electronic sensor chips and the simplification of the test circuit by the flexible internal structure of the WSMX card. For general use circuit of sensor chips that use differential signals as input, single-ended signals are often used as input during testing, and then converted through a single-ended to differential circuit. However, the differential interface inside the WSMX card has Offset DACs at the P and N terminals, which can flexibly adjust the output voltage and directly transmit it to the sensor chip as a differential interface, avoiding the effects of manual and software zero calibration and temperature drift.

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Publication Details

Published
2025-03-24
DOI
https://doi.org/10.1109/cstic64481.2025.11017922
Primary Topic
Wireless Sensor Networks and IoT
Type
article
Field-Weighted Citation Impact
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article

Application of Wsmx Cards in Sensor Chip Testing and The Resulting Simplification of Test Circuits

Liuhao Chen
Wireless Sensor Networks and IoT
article

Application of Wsmx Cards in Sensor Chip Testing and The Resulting Simplification of Test Circuits

Liuhao Chen
article en

Abstract

This paper introduces the application of the WSMX card in the testing of automotive electronic sensor chips and the simplification of the test circuit by the flexible internal structure of the WSMX card. For general use circuit of sensor chips that use differential signals as input, single-ended signals are often used as input during testing, and then converted through a single-ended to differential circuit. However, the differential interface inside the WSMX card has Offset DACs at the P and N terminals, which can flexibly adjust the output voltage and directly transmit it to the sensor chip as a differential interface, avoiding the effects of manual and software zero calibration and temperature drift.

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Application of Wsmx Cards in Sensor Chip Testing and The Resulting Simplification of Test Circuits — Liuhao Chen · (2025) | TGRS Research Map | TGRS