A Continuous Data Sampling Solution for MEMS ASIC Test on V93000

With the development of MEMS sensors, the testing of internal ASIC as a signal processing module has become increasingly important and complex. The embedded FIFO is widely used in MEMS sensors as a buffer to store samples and can effectively reduce the frequent access between the system and MEMS. For typical ADC test, ATE can capture output data directly or access corresponding RAM which restores a piece of ADC sampling data. In this paper, ATE could only get sampling data from the FIFO which is connected to the output ADC. However, the data stream update rate in the FIFO is inconsistent due to the different data transfer rates of different ADCs. Therefore, it is difficult to match the ATE data acquisition rate with the FIFO updated data stream. In order to get a continuous piece of data with satisfactory length for further DSP and evaluation, the test program should be carefully designed to deal with the output data rate of the FIFO.Hence, this paper provides an efficient continuous sampling solution on the V93000. A four-layer COGO node procedure structure is designed. This solution can complete low-latency sampling inside the ATE to avoid data overflow and ensure the continuity of test data. There is no need to send the sampling data back to the host computer for judgment in the whole data sampling process, so the overall test time is greatly reduced.