FPGA-Based Test Platform for 56-Gbps NRZ Digital ICs and Systems

This presentation briefly reviews the development of high-speed digital Automated Test Equipment (ATE) that exhibits an exponential performance growth trend which has persisted through several decades. Recent work is presented that leverages 14-28-Gbps FPGAs to extend usable test rates to 56 Gbps. This work leads to a planned development for extending beyond 100 Gbps.

Authors

Publication Details

Published
2025-03-24
DOI
https://doi.org/10.1109/cstic64481.2025.11017873
Citations
1
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
2.27
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article

FPGA-Based Test Platform for 56-Gbps NRZ Digital ICs and Systems

D.C. Keezer, Cao Wang
1 citations
VLSI and Analog Circuit Testing
2.27
article

FPGA-Based Test Platform for 56-Gbps NRZ Digital ICs and Systems

D.C. Keezer, Cao Wang
article en
1 citations

Abstract

This presentation briefly reviews the development of high-speed digital Automated Test Equipment (ATE) that exhibits an exponential performance growth trend which has persisted through several decades. Recent work is presented that leverages 14-28-Gbps FPGAs to extend usable test rates to 56 Gbps. This work leads to a planned development for extending beyond 100 Gbps.

Industry, innovation and infrastructure
Openalex Percentile: Top 15%
VLSI and Analog Circuit Testing
2.27
DOISourceOpenAlex
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FPGA-Based Test Platform for 56-Gbps NRZ Digital ICs and Systems — D.C. Keezer, Cao Wang · (2025) | TGRS Research Map | TGRS