Cd Step Application in Edge Air Layer Structure Measurement for Bulk Acoustic Resonator

A vital component of modern communication systems, bulk acoustic wave resonators (BAW) function as filters, oscillators, and sensors. In a BAW device, the acoustic waves are confined within a specific region to achieve efficient resonance. The air ring structure, including the edge air layer structure, prevents acoustic energy from leaking. However, measuring the critical dimensions (CD) of edge air layers is challenging. In this paper, we will show how Onto Innovation’s IVS<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">™</sup> 220 optical overlay and CD metrology system can measure the edge air layer structure using a CD step application. The IVS 220 system provides good repeatability and high throughput [130 wph, five (5) fields, one (1) site per field]. In addition, the IVS 220 system also can be used for overlay measurement, CD measurement (including angle CD and diameter of the circle or hole), and Z height measurement.

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Published
2025-03-24
DOI
https://doi.org/10.1109/cstic64481.2025.11017962
Primary Topic
Acoustic Wave Resonator Technologies
Type
article
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article

Cd Step Application in Edge Air Layer Structure Measurement for Bulk Acoustic Resonator

Johnny Mu, Willis Laurens Emery, Huayuan Li, Hong Hong
Acoustic Wave Resonator Technologies
article

Cd Step Application in Edge Air Layer Structure Measurement for Bulk Acoustic Resonator

Johnny Mu, Willis Laurens Emery, Huayuan Li, Hong Hong
article en

Abstract

A vital component of modern communication systems, bulk acoustic wave resonators (BAW) function as filters, oscillators, and sensors. In a BAW device, the acoustic waves are confined within a specific region to achieve efficient resonance. The air ring structure, including the edge air layer structure, prevents acoustic energy from leaking. However, measuring the critical dimensions (CD) of edge air layers is challenging. In this paper, we will show how Onto Innovation’s IVS<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">™</sup> 220 optical overlay and CD metrology system can measure the edge air layer structure using a CD step application. The IVS 220 system provides good repeatability and high throughput [130 wph, five (5) fields, one (1) site per field]. In addition, the IVS 220 system also can be used for overlay measurement, CD measurement (including angle CD and diameter of the circle or hole), and Z height measurement.

Onto Innovation (United States) (US)
Affordable and clean energy
Openalex Percentile: Top 88%
Acoustic Wave Resonator Technologies
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Cd Step Application in Edge Air Layer Structure Measurement for Bulk Acoustic Resonator — Johnny Mu, Willis Laurens Emery, et al. · (2025) | TGRS Research Map | TGRS