Automatically Monitor and Process V93K Pattern for Large Scale High-speed Digital Devices on ADVANTEST ATE platform

High speed digital device becomes popular due to the requirements for data transmission speed and efficiency in computing and artificial intelligence fields. Inside testing, high speed SCAN <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">[1]</sup> and BIST, etc. occupy a large proportion in whole test program through protocol like JTAG, SPI <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">[2]</sup> etc.During pattern verification typical handling method is really timing consuming. A common and universal configured pattern solution is necessary. Based on these requirements, this paper introduces the relevant analysis, framework design and result implemented on ADVANTEST V93K ATE platform.