The Etching of SiO<sub>2</sub>/Mo-MoN/SiO<sub>2</sub>/TiN Stacks in an Inductively Coupled Plasma System

The dry etching characteristics of Silicon oxide/Mo-MoN/Silicon oxide/TiN films to form channel hole structure were investigated using an inductively coupled plasma system. In this work, silicon oxide was etched with CF<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</inf>/CHF<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>/AR gas, TiN was etched using Cl<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>/N<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>/AR gas, and Mo-MoN was etched under Cl<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>/O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> and SF<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</inf>/O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> gas conditions. It was found that replacing the etching gas of Mo-MoN film from Cl<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>/O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> to SF<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</inf>/O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>, a relatively smooth and vertical Silicon oxide/Mo-MoN/Silicon oxide/TiN channel hole structure is obtained.

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Publication Details

Published
2025-03-24
DOI
https://doi.org/10.1109/cstic64481.2025.11017959
Primary Topic
Metal and Thin Film Mechanics
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article
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article

The Etching of SiO2/Mo-MoN/SiO2/TiN Stacks in an Inductively Coupled Plasma System

Hong‐Bo Sun, Baodong Han, Chao Zhao, Yaqiong Li et al.
Metal and Thin Film Mechanics
article

The Etching of SiO2/Mo-MoN/SiO2/TiN Stacks in an Inductively Coupled Plasma System

Hong‐Bo Sun, Baodong Han, Chao Zhao, Yaqiong Li, Linjie Hou, Jirong Sun, Zhonghua Jin
article en

Abstract

The dry etching characteristics of Silicon oxide/Mo-MoN/Silicon oxide/TiN films to form channel hole structure were investigated using an inductively coupled plasma system. In this work, silicon oxide was etched with CF<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</inf>/CHF<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf>/AR gas, TiN was etched using Cl<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>/N<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>/AR gas, and Mo-MoN was etched under Cl<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>/O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> and SF<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</inf>/O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> gas conditions. It was found that replacing the etching gas of Mo-MoN film from Cl<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>/O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> to SF<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</inf>/O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>, a relatively smooth and vertical Silicon oxide/Mo-MoN/Silicon oxide/TiN channel hole structure is obtained.

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