Semi-Supervised Probabilistic Learning Network for Soft Sensor Modeling With Partially Labeled Data

Deep probabilistic learning networks have been applied in industrial soft sensors. However, they face significant challenges in latent variable inference, deep learning backend implementation, and labeled data scarcity. The first challenge arises when covariates directly infer the latent variable, potentially leading to inaccuracies. The second stems from discrepancies between the theoretical probabilistic distribution and practical instance-based deep learning backends. The third is commonly encountered in soft sensor applications, where unlabeled data often go unused, reducing accuracy. To address these challenges, this work proposes a novel semi-supervised probabilistic learning network (SS-PLN) for soft sensor modeling with partially labeled data. The first issue is addressed by formulating an optimization problem as the model’s learning objective. This optimization is efficiently solved by investigating the input of inference network through analyzing the optimal solution’s structure. For the second issue, mean and covariance equations are used to represent probabilistic distributions, ensuring effective deep learning backends. The third issue is addressed by integrating supervised and unsupervised probabilistic learning networks to form the SS-PLN model, thereby maximizing the use of unlabeled data and enhancing the soft sensing performance. The feasibility and effectiveness of the proposed SS-PLN are validated through comparisons with recent semi-supervised learning methods, using data from two industrial processes.

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Publication Details

Journal
IEEE Transactions on Automation Science and Engineering
Published
2025-01-01
DOI
https://doi.org/10.1109/tase.2025.3576122
Citations
4
Primary Topic
Fault Detection and Control Systems
Type
article
Field-Weighted Citation Impact
4.86

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Semi-Supervised Probabilistic Learning Network for Soft Sensor Modeling With Partially Labeled Data

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4 citations
IEEE Transactions on Automation Science and Engineering
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article

Semi-Supervised Probabilistic Learning Network for Soft Sensor Modeling With Partially Labeled Data

Ronghuan Li, Xudong Shi, Weili Xiong, Humberto Morales, Adriana Amicarelli, Wangya Huang
article en
4 citations

Abstract

Deep probabilistic learning networks have been applied in industrial soft sensors. However, they face significant challenges in latent variable inference, deep learning backend implementation, and labeled data scarcity. The first challenge arises when covariates directly infer the latent variable, potentially leading to inaccuracies. The second stems from discrepancies between the theoretical probabilistic distribution and practical instance-based deep learning backends. The third is commonly encountered in soft sensor applications, where unlabeled data often go unused, reducing accuracy. To address these challenges, this work proposes a novel semi-supervised probabilistic learning network (SS-PLN) for soft sensor modeling with partially labeled data. The first issue is addressed by formulating an optimization problem as the model’s learning objective. This optimization is efficiently solved by investigating the input of inference network through analyzing the optimal solution’s structure. For the second issue, mean and covariance equations are used to represent probabilistic distributions, ensuring effective deep learning backends. The third issue is addressed by integrating supervised and unsupervised probabilistic learning networks to form the SS-PLN model, thereby maximizing the use of unlabeled data and enhancing the soft sensing performance. The feasibility and effectiveness of the proposed SS-PLN are validated through comparisons with recent semi-supervised learning methods, using data from two industrial processes.

IEEE Transactions on Automation Science and EngineeringVol. 22
Jiangnan University (CN), Tongji University (CN), Consejo Nacional de Investigaciones Científicas y Técnicas (AR), National University of San Juan (AR), Centro Científico Tecnológico - San Juan (AR)
National Natural Science Foundation of China
Openalex Percentile: Top 5%
Fault Detection and Control Systems
4.86
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