Damage to lead iodide under XUV and x-ray laser irradiation
Lead iodide, a wide band gap semiconductor with a layered crystalline structure, is a material exhibiting interesting and useful behavior when exposed to either ionizing or non-ionizing radiation. Yet, the mechanism of damage to lead iodide by XUV and X-ray radiation remains contested, especially at extreme dose rates achieved by powerful modern sources such as capillary-discharge and free-electron lasers. A potentially complex interplay of thermal and non-thermal effects may govern the damage process. In this contribution, results obtained for PbI2 with focused beams of x-ray FELs and XUV capillary-discharge lasers are presented with attention to the role of photon energies and pulse durations, and with comparison of experimental results to computer simulations.
Authors
- Vojtěch Vozda (ORCID: https://orcid.org/0000-0002-5426-1519)
- Ladislav Fekete (ORCID: https://orcid.org/0000-0002-8548-2613)
- J. Chalupský (ORCID: https://orcid.org/0000-0001-6930-1774)
- V. Hájková (ORCID: https://orcid.org/0000-0002-0776-6012)
- Michal Šmíd (ORCID: https://orcid.org/0000-0002-7162-7500)
- M. Krupka (ORCID: https://orcid.org/0000-0003-0784-4145)
- L. Juha (ORCID: https://orcid.org/0000-0003-4189-8753)
- Nikita Medvedev (ORCID: https://orcid.org/0000-0003-0491-1090)
- Luděk Vyšín (ORCID: https://orcid.org/0000-0002-8549-0859)
- Šimon Jelínek (ORCID: https://orcid.org/0000-0002-1999-811X)
- T. Burian (ORCID: https://orcid.org/0000-0003-3982-9978)
- R. Dudžák (ORCID: https://orcid.org/0000-0002-2162-2103)
- J. Krása (ORCID: https://orcid.org/0000-0002-3888-8370)
- Jakub Bulička (ORCID: https://orcid.org/0009-0009-1046-8014)
- Alžběta Horynová
- Zuzana Valdová
Institutions
- Helmholtz-Zentrum Dresden-Rossendorf (DE)
- FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic (CZ)
Publication Details
- Published
- 2025-06-03
- DOI
- https://doi.org/10.1117/12.3056590
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00