Femtosecond X-ray cross-correlation analysis of disordered crystals forming in a supercooled atomic liquid

We demonstrate an advanced scattering method for accessing the 3D reciprocal space of crystalline structures forming in a rapidly supercooled noble-gas liquid using a combination of femtosecond X-ray diffraction and X-ray cross-correlation analysis. The preservation of angular information from the scattering signal allows probing the structure factor along selected directions in reciprocal space and identifying signatures undetectable in azimuthally integrated scattering curves. Therefore, more information from serial diffraction experiments on stochastic crystallization processes can be retrieved despite the inherent variation of the crystal orientation and morphology for each single probe. We also demonstrate how different features in the correlation maps can be associated with certain forms of stacking faults, which enables studying such defects in situ and disentangling them from simultaneous changes in crystal size and temperature.

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Publication Details

Journal
IUCrJ
Published
2025-06-03
DOI
https://doi.org/10.1107/s2052252525004063
Citations
2
Primary Topic
Geological and Geochemical Analysis
Type
article
Field-Weighted Citation Impact
3.73

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article

Femtosecond X-ray cross-correlation analysis of disordered crystals forming in a supercooled atomic liquid

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2 citations
IUCrJ
Geological and Geochemical Analysis
3.73
article

Femtosecond X-ray cross-correlation analysis of disordered crystals forming in a supercooled atomic liquid

Anton Kalinin, Dmitry Lapkin, Ulrike Boesenberg, Claudia Goy, Michele Caresana, Luca Gelisio, Tiberio A. Ezquerra, Francesco Mambretti, Jörg Hallmann, Roman Shayduk, Alexander Schottelius, G. Grübel, Ruslan P. Kurta, Anders Madsen, R. E. Grisenti, Johannes Möller, Francesco Dallari, René Steinbrügge, Markus Scholz, Alexey V. Zozulya, Ivan Vartaniants, Frédéric Caupin, D. E. Galli, Florian Trinter, Felix Lehmkühler, Chan Kim, J. M. Fernández
article en
2 citations

Abstract

We demonstrate an advanced scattering method for accessing the 3D reciprocal space of crystalline structures forming in a rapidly supercooled noble-gas liquid using a combination of femtosecond X-ray diffraction and X-ray cross-correlation analysis. The preservation of angular information from the scattering signal allows probing the structure factor along selected directions in reciprocal space and identifying signatures undetectable in azimuthally integrated scattering curves. Therefore, more information from serial diffraction experiments on stochastic crystallization processes can be retrieved despite the inherent variation of the crystal orientation and morphology for each single probe. We also demonstrate how different features in the correlation maps can be associated with certain forms of stacking faults, which enables studying such defects in situ and disentangling them from simultaneous changes in crystal size and temperature.

IUCrJVol. 12(4)
Université Claude Bernard Lyon 1 (FR), Goethe University Frankfurt (DE), Centre National de la Recherche Scientifique (FR), GSI Helmholtz Centre for Heavy Ion Research (DE), Institut Universitaire de France (FR), University of Milan (IT), Fritz Haber Institute of the Max Planck Society (DE), Deutsches Elektronen-Synchrotron DESY (DE), Institut Lumière Matière (FR), Max Planck Institute for the Structure and Dynamics of Matter (DE), Instituto de Estructura de la Materia (ES), Hamburg Centre for Ultrafast Imaging, European X-Ray Free-Electron Laser (DE)
Deutsche Forschungsgemeinschaft, Bundesministerium für Bildung und Forschung, Deutsches Elektronen-Synchrotron
Openalex Percentile: Top 8%
Geological and Geochemical Analysis
3.73
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