Real-time evaluation of charge transfer patterns at buried ionotronic interfaces
This study introduces in situ -EIS and triboelectrification perturbation to evaluate charge dynamics at insulating–metallic buried interfaces.
Authors
- Walid A. Daoud (ORCID: https://orcid.org/0000-0002-5807-5043)
- Johnny Sik Chun Lo (ORCID: https://orcid.org/0000-0001-9543-5506)
- Carol Sze Ki Lin (ORCID: https://orcid.org/0000-0002-8493-4307)
- Irum Firdous (ORCID: https://orcid.org/0000-0001-6298-5384)
- Muhammad Fahim (ORCID: https://orcid.org/0000-0002-7926-0109)
- Ruoxuan Ye
Institutions
- City University of Hong Kong (HK)
- City University of Hong Kong, Shenzhen Research Institute (CN)
Publication Details
- Journal
- Journal of Materials Chemistry A
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d5ta01326g
- Citations
- 2
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 1.46
Funders
- National Natural Science Foundation of China
- Research Grants Council, University Grants Committee