Mitigating X-ray-induced damage for accurate analysis of battery cathodes using transmission X-ray microscopy

We investigate the impact of X-ray-induced damage on the evolution of battery cathodes using synchrotron transmission X-ray microscopy. In an <i>operando</i> coin cell, exposure to the X-ray beam can induce bubble formation, potentially rendering cathode particles electrochemically inactive and displacing particles from their initial position. However, utilizing external pressure on a pouch cell can mitigate bubble formation and its associated effects.