A 13-Bit ENOB Fully Asynchronous Noise-Shaping SAR ADC With Coarse-Fine Comparison, Mismatch Error Shaping and Digital Prediction

High-resolution ADCs require low noise and low distortion while consuming minimal power. This paper presents a power-efficient, calibration-free, 2nd-order noise-shaping (NS) SAR ADC. Mismatch error shaping (MES) is employed to reduce distortion from capacitive DAC mismatches. The resulting input range loss is compensated for by an additional digital prediction (DP) method. To mitigate the high power consumption of the multi-input dynamic comparator, this work proposes a coarse-fine comparison (CFC) scheme with an optimized error-correction capability, enabling the ADC to switch between SAR and NS-SAR modes. This approach reduces the power consumption of the comparator while maintaining NS functionality. Furthermore, to eliminate the need for an external high-speed clock to control SAR logic and NS operation, this work utilizes a fully asynchronous logic driven solely by a sample-and-hold clock. Implemented in standard 130-nm CMOS technology, this prototype ADC achieves a measured 81.54-dB SNDR (13.25-bit ENOB) in a 100-kHz bandwidth with an oversampling ratio (OSR) of 25.