AVOID: Automated Void Detection in STL Files

Additive manufacturing is a multi-billion dollar industry 21.58 billion in 2024), so its processes should be dependable and secure. Malicious actors can inject negative spaces, known as voids, in STL files, which can have a devastating impact on a final product's quality. Current ways of detecting voids use machine sensor or simulation data, and physical verification measures after printing. However, to the best of our knowledge, no method exists for detecting hidden voids solely at the STL level. Void detection at this level is inexpensive, and has the potential to detect voids in designs en masse. In this work, we propose <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small>, a new approach to detect hidden voids. It both detects voids, and assesses their risk of weakening the manufactured part. <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small> performs risk assessment based on the size and location of each detected void. We empirically evaluated <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small> using several large datasets, in total thousands of STL files, each with multiple hidden voids. We found that <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small> is highly accurate, with 97.7% recall, 98.1% precision, and 99% F1 on average across six data sets. <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small> is also robust, scalable, and efficient. We find that high risk voids account for approximately 7% of all detected voids inserted randomly.

Authors

Institutions

Publication Details

Journal
IEEE Transactions on Dependable and Secure Computing
Published
2025-06-02
DOI
https://doi.org/10.1109/tdsc.2025.3573652
Primary Topic
Web Data Mining and Analysis
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

AVOID: Automated Void Detection in STL Files

Witawas Srisa‐an, Sarah Roscoe, Jitender S. Deogun, Yi Qian et al.
IEEE Transactions on Dependable and Secure Computing
Web Data Mining and Analysis
article

AVOID: Automated Void Detection in STL Files

Witawas Srisa‐an, Sarah Roscoe, Jitender S. Deogun, Yi Qian, C.A. Gunawardena, Logan Hellbusch, Gabriela Ciocarlie
article en

Abstract

Additive manufacturing is a multi-billion dollar industry 21.58 billion in 2024), so its processes should be dependable and secure. Malicious actors can inject negative spaces, known as voids, in STL files, which can have a devastating impact on a final product's quality. Current ways of detecting voids use machine sensor or simulation data, and physical verification measures after printing. However, to the best of our knowledge, no method exists for detecting hidden voids solely at the STL level. Void detection at this level is inexpensive, and has the potential to detect voids in designs en masse. In this work, we propose <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small>, a new approach to detect hidden voids. It both detects voids, and assesses their risk of weakening the manufactured part. <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small> performs risk assessment based on the size and location of each detected void. We empirically evaluated <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small> using several large datasets, in total thousands of STL files, each with multiple hidden voids. We found that <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small> is highly accurate, with 97.7% recall, 98.1% precision, and 99% F1 on average across six data sets. <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">AVOID</small> is also robust, scalable, and efficient. We find that high risk voids account for approximately 7% of all detected voids inserted randomly.

IEEE Transactions on Dependable and Secure ComputingVol. 22(5)
University of Nebraska–Lincoln (US), Texas A&M University – San Antonio (US)
Reduced inequalities
Openalex Percentile: Top 83%
Web Data Mining and Analysis
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.