Bayesian deep-learning structured illumination microscopy enables reliable super-resolution imaging with uncertainty quantification

The objective of optical super-resolution imaging is to acquire reliable sub-diffraction information on bioprocesses to facilitate scientific discovery. Structured illumination microscopy (SIM) is acknowledged as the optimal modality for live-cell super-resolution imaging. Although recent deep learning techniques have substantially advanced SIM, their transparency and reliability remain uncertain and under-explored, often resulting in unreliable results and biological misinterpretation. Here, we develop Bayesian deep learning (BayesDL) for SIM, which enhances the reconstruction of densely labeled structures while enabling the quantification of super-resolution uncertainty. With the uncertainty, BayesDL-SIM achieves high-fidelity distribution-informed SIM imaging, allowing for the communication of credibility estimates to users regarding the model outcomes. We also demonstrate that BayesDL-SIM boosts SIM reliability by identifying and preventing erroneous generalizations in various model misuse scenarios. Moreover, the BayesDL uncertainty shows versatile utilities for daily super-resolution imaging, such as error estimation, data acquisition evaluation, etc. Furthermore, we demonstrate the effectiveness and superiority of BayesDL-SIM in live-cell imaging, which reliably reveals F-actin dynamics and the reorganization of the cell cytoskeleton. This work lays the foundation for the reliable implementation of deep learning-based SIM methods in practical applications.

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Publication Details

Journal
Nature Communications
Published
2025-05-30
DOI
https://doi.org/10.1038/s41467-025-60093-w
Citations
14
Primary Topic
Advanced Fluorescence Microscopy Techniques
Type
article
Field-Weighted Citation Impact
22.88

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article

Bayesian deep-learning structured illumination microscopy enables reliable super-resolution imaging with uncertainty quantification

Shan Tan, Jiahao Liu, Dong Li, Tao Liu
14 citations
Nature Communications
Advanced Fluorescence Microscopy Techniques
22.88
article

Bayesian deep-learning structured illumination microscopy enables reliable super-resolution imaging with uncertainty quantification

Shan Tan, Jiahao Liu, Dong Li, Tao Liu
article en
14 citations

Abstract

The objective of optical super-resolution imaging is to acquire reliable sub-diffraction information on bioprocesses to facilitate scientific discovery. Structured illumination microscopy (SIM) is acknowledged as the optimal modality for live-cell super-resolution imaging. Although recent deep learning techniques have substantially advanced SIM, their transparency and reliability remain uncertain and under-explored, often resulting in unreliable results and biological misinterpretation. Here, we develop Bayesian deep learning (BayesDL) for SIM, which enhances the reconstruction of densely labeled structures while enabling the quantification of super-resolution uncertainty. With the uncertainty, BayesDL-SIM achieves high-fidelity distribution-informed SIM imaging, allowing for the communication of credibility estimates to users regarding the model outcomes. We also demonstrate that BayesDL-SIM boosts SIM reliability by identifying and preventing erroneous generalizations in various model misuse scenarios. Moreover, the BayesDL uncertainty shows versatile utilities for daily super-resolution imaging, such as error estimation, data acquisition evaluation, etc. Furthermore, we demonstrate the effectiveness and superiority of BayesDL-SIM in live-cell imaging, which reliably reveals F-actin dynamics and the reorganization of the cell cytoskeleton. This work lays the foundation for the reliable implementation of deep learning-based SIM methods in practical applications.

Nature CommunicationsVol. 16(1)
King Center (US), Center for Life Sciences (CN), Huazhong University of Science and Technology (CN)
National Natural Science Foundation of China
Climate action
Openalex Percentile: Top 0%
Advanced Fluorescence Microscopy Techniques
22.88
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