Study of the Elemental Composition of Thin Films of CoNi and FeNi Alloys by X-ray Spectral Microanalysis

Journal of Nano- and Electronic Physics. Scientific journal. ISSN: 2077-6772. Journal abbreviation: J. Nano- Electron. Phys. No page charges. All articles are freely available on-line. Issued 4 times per year. Publisher: Sumy State University. (Sumy, Ukraine)

Authors

V. M. Zubko
V. B. Loboda
V. О. Kravchenko (ORCID: https://orcid.org/0000-0002-4185-8279)
С. М. Хурсенко (ORCID: https://orcid.org/0000-0001-6307-2042)
A. V. Chepizhnyi

Publication Details

Journal: Journal of Nano- and Electronic Physics
Published: 2025-01-01
DOI: https://doi.org/10.21272/jnep.17(2).02020
Primary Topic: Advanced Materials Characterization Techniques
Type: article
Field-Weighted Citation Impact: 0.00

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article

Study of the Elemental Composition of Thin Films of CoNi and FeNi Alloys by X-ray Spectral Microanalysis

V. M. Zubko, V. B. Loboda, V. О. Kravchenko, С. М. Хурсенко et al.

Jan 1, 2025

Journal of Nano- and Electronic Physics

Advanced Materials Characterization Techniques

article

Study of the Elemental Composition of Thin Films of CoNi and FeNi Alloys by X-ray Spectral Microanalysis

V. M. Zubko, V. B. Loboda, V. О. Kravchenko, С. М. Хурсенко, A. V. Chepizhnyi

January 1, 2025article en

Abstract

Journal of Nano- and Electronic PhysicsVol. 17(2)

Openalex Percentile: Top 89%

Advanced Materials Characterization Techniques

DOI Open Access PDF OpenAlex

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Study of the Elemental Composition of Thin Films of CoNi and FeNi Alloys by X-ray Spectral Microanalysis — V. M. Zubko, V. B. Loboda, et al. · Journal of Nano- and Electronic Physics (2025) | TGRS Research Map | TGRS