Die Area Reduction by Decongesting Top Channels Using Novel Feedthrough Insertion Methodology in Hierarchical SoC Designs

Die size reduction has been one of the foremost objectives in systems-on-chip (SoC) designs. While previous approaches attempt it by reducing congestion of chip as a whole, there is little attempt to specifically decongest top channel. In channel based hierarchical non-IO limited SoC designs, feedthrough insertion can be an important step in floorplan stage to improve the routing resource utilization, decongest top channels and hence the die area saving. Usual feedthrough insertion approaches are implemented manually or handled in flatten design, however it is challenging to deal with the large number connections on the top, high dependency with RTL, porting new feedthrough ports at subchip level, and logical equivalence coherency checkout. We present a scheme to conquer these issues by using a novel feedthrough insertion methodology.

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Publication Details

Published
2025-04-23
DOI
https://doi.org/10.1109/isqed65160.2025.11014329
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

Die Area Reduction by Decongesting Top Channels Using Novel Feedthrough Insertion Methodology in Hierarchical SoC Designs

Vivek Joshi, Roger Griesmer, Rajanikant Sakariya, Subhadeep Aich
VLSI and Analog Circuit Testing
article

Die Area Reduction by Decongesting Top Channels Using Novel Feedthrough Insertion Methodology in Hierarchical SoC Designs

Vivek Joshi, Roger Griesmer, Rajanikant Sakariya, Subhadeep Aich
article en

Abstract

Die size reduction has been one of the foremost objectives in systems-on-chip (SoC) designs. While previous approaches attempt it by reducing congestion of chip as a whole, there is little attempt to specifically decongest top channel. In channel based hierarchical non-IO limited SoC designs, feedthrough insertion can be an important step in floorplan stage to improve the routing resource utilization, decongest top channels and hence the die area saving. Usual feedthrough insertion approaches are implemented manually or handled in flatten design, however it is challenging to deal with the large number connections on the top, high dependency with RTL, porting new feedthrough ports at subchip level, and logical equivalence coherency checkout. We present a scheme to conquer these issues by using a novel feedthrough insertion methodology.

Texas Instruments (United States) (US)
Openalex Percentile: Top 89%
VLSI and Analog Circuit Testing
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