Exploiting the Presence of Abundant Zero Data to Improve NVM Lifespan
The emerging Non-volatile Memories are expected to play a big role in building large scale and energy-efficient memory systems in the future, owing to their excellent scalability and low leakage power consumption. Downsides like Low endurance, high write-energy and slow writes, however thwart their adoption as future memory options. In this paper, we propose a compression technique called ZeCom that mitigates the low endurance issue of non-volatile memories by effectively compressing the incoming blocks to NVM-based main memory by removing the zero words present within the block. While ZeCom lowers bit-flips in memory by reducing the amount of data written in memory, we apply Flip-N-Write (FNW) encoding technique on the compressed block in an adaptive manner (termed adFNW) to further reduce bit-flips and improve endurance of memory at minimal storage overhead. The combined approach ZeCom+adFNW reduces bit-flips considerably and leads to significant improvement in memory lifetime.
Authors
- Arijit Nath (ORCID: https://orcid.org/0000-0003-4692-8472)
- Harsh Raj (ORCID: https://orcid.org/0000-0002-6128-2991)
Institutions
- Indian Institute of Technology Guwahati (IN)
- Indian Institute of Information Technology Guwahati (IN)
Publication Details
- Published
- 2025-04-23
- DOI
- https://doi.org/10.1109/isqed65160.2025.11014352
- Citations
- 1
- Primary Topic
- Non-Destructive Testing Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.71