A Sequential-Interval Optimal Sampling Strategy Based on Reliability Prediction Under Wiener Process

For satellite electronic components characterized by high reliability and long lifespan, achieving improved efficiency in reliability prediction is essential when only a limited amount of data is available. Many studies have collected degradation data using uniform sampling strategies. In this work, we propose sequential-interval G- and D-optimal sampling strategies for in-orbit degradation data collection based on the Wiener process, aiming to enhance the efficiency of reliability prediction. Finally, a simulation study is performed to verify the effectiveness of the proposed strategies. This study utilizes both linear and nonlinear models of satellite MOSFETs and employs the Monte Carlo method.