Simulation Insights of AlGaN/GaN HEMT Structure Optimization for Biosensor Applications
This article examines the effects of gate-to-drain length (L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">GD</inf>), source-to-gate length (L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SG</inf>), gate length (L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">G</inf>), and environmental conditions like temperature on transfer, transconductance, and output characteristics of HEMT. The Silvaco Atlas device simulation tool was used to retrieve the results. As temperature, source-to-gate length, and gate length grow, peak transconductance, drain saturation current and device ON current decrease. As gate-to-drain length increases, so do peak transconductance, drain saturation current, and device ON current. Variations in the device's L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">G</inf>, L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SG</inf>, L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">GD</inf>, and environmental conditions like temperature alter the device's current characteristics, which can be utilized as a biosensor sensing metric. HEMT-based biosensors, like AlGaN/GaN MOSHEMTs, are highly sensitive to device geometry (L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">G</inf>, L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">SG</inf>, and L<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">GD</inf>). All these factors contribute to the overall detection accuracy, sensitivity, response time, and power consumption.
Authors
- Yashwant Singh (ORCID: https://orcid.org/0000-0003-2833-2093)
- Neeraj Gupta (ORCID: https://orcid.org/0000-0003-0493-5412)
- Vinay Kanungo (ORCID: https://orcid.org/0000-0001-5926-3524)
- Ashish Kumar (ORCID: https://orcid.org/0000-0003-1523-5454)
- Nisha Charaya
Institutions
- National Institute of Technology Raipur (IN)
- Institute of Technology Management (IN)
Publication Details
- Published
- 2025-04-05
- DOI
- https://doi.org/10.1109/devic63749.2025.11012385
- Citations
- 2
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 2.52