Design and Analysis of a High-Stability HS-12T SRAM Cell for Low-Power Applications

In this paper, the HS-12, a very stable 12T Static Random-Access Memory (SRAM) cell, is designed with better read operation. Traditional 6T SRAM cells suffer from major constraints, especially concerning read stability and power efficiency. To resolve these, the proposed 12T SRAM cell integrates extra transistors that practically separate read and write operations and thereby provide improved read, write, and hold stability. Critical performance indicators like read stability, write stability, power dissipation, and access times are comprehensively examined and contrasted with current SRAM architectures. Simulations with 45nm CMOS technology confirm that the HS-12T SRAM cell displays enhanced resistance to process, voltage, and temperature fluctuations, providing reliable operation under a wide range of conditions. Enhanced reading stability is especially beneficial for those applications with high reliability and low power requirements, like cache memory in handheld and embedded systems. This work offers a promising approach to future SRAM designs, providing an optimal balance between performance, energy efficiency, and robustness, and opens the door to future innovations in memory technology.

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Publication Details

Published
2025-04-05
DOI
https://doi.org/10.1109/devic63749.2025.11012412
Primary Topic
VLSI and Analog Circuit Testing
Type
article
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article

Design and Analysis of a High-Stability HS-12T SRAM Cell for Low-Power Applications

Bhargavi Jha, Mukul Jangid, Ankita Ojha, Sateesh Kourav et al.
VLSI and Analog Circuit Testing
article

Design and Analysis of a High-Stability HS-12T SRAM Cell for Low-Power Applications

Bhargavi Jha, Mukul Jangid, Ankita Ojha, Sateesh Kourav, Sunil Kumar Shah, Ayan Kesharwani
article en

Abstract

In this paper, the HS-12, a very stable 12T Static Random-Access Memory (SRAM) cell, is designed with better read operation. Traditional 6T SRAM cells suffer from major constraints, especially concerning read stability and power efficiency. To resolve these, the proposed 12T SRAM cell integrates extra transistors that practically separate read and write operations and thereby provide improved read, write, and hold stability. Critical performance indicators like read stability, write stability, power dissipation, and access times are comprehensively examined and contrasted with current SRAM architectures. Simulations with 45nm CMOS technology confirm that the HS-12T SRAM cell displays enhanced resistance to process, voltage, and temperature fluctuations, providing reliable operation under a wide range of conditions. Enhanced reading stability is especially beneficial for those applications with high reliability and low power requirements, like cache memory in handheld and embedded systems. This work offers a promising approach to future SRAM designs, providing an optimal balance between performance, energy efficiency, and robustness, and opens the door to future innovations in memory technology.

Indian Institute of Information Technology Allahabad (IN), Punjab Engineering College (IN)
Affordable and clean energy
Openalex Percentile: Top 89%
VLSI and Analog Circuit Testing
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Design and Analysis of a High-Stability HS-12T SRAM Cell for Low-Power Applications — Bhargavi Jha, Mukul Jangid, et al. · (2025) | TGRS Research Map | TGRS