Semi-SJ high-k IGBT: An Effective Approach to Increase Breakdown Voltage
In this paper, we introduce an innovative semi-superjunction (semi-SJ) high-k IGBT that showcases remarkable advancements in Forward breakdown voltage (BVF) compared to traditional semi-SJ IGBTs. Our comprehensive research reveals a substantial enhancement of 23.07% in breakdown voltage, a significant leap that underscores the efficacy of our design. This improvement stems from the meticulous optimization of redistributed electric field lines, which plays a critical role in achieving superior electrical performance. The implications of this work open new avenues for the development of high-efficiency power electronics, paving the way for more robust and reliable devices in various applications.
Authors
- Nilesh Goel (ORCID: https://orcid.org/0000-0001-8406-7867)
- Alok Naugarhiya (ORCID: https://orcid.org/0000-0003-0182-2498)
- Vidya Bhushan Rathore
Institutions
- Synergy University Dubai (AE)
- National Institute of Technology Raipur (IN)
- Birla Institute of Technology and Science, Pilani - Dubai Campus (AE)
Publication Details
- Published
- 2025-04-05
- DOI
- https://doi.org/10.1109/devic63749.2025.11012566
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00