Design of Low Power and High Speed CAM-assisted 9T SRAM cell on 14nm FinFET Technology

One of the key considerations in the design of low power Very-large-scale integration (VLSI) circuits is leakage power dissipation, which is entirely responsible for the circuit's overall performance. Because of the leakage and power consumption, the battery's long-lasting components lose their functionality quickly and reduce the system performance. So, in this research, the Fin-shaped Field-Effect Transistor (FinFET) based 9T SRAM cell is intended for achieving low power consumption and leakage current to speed up the write operations with the Content Addressable Memory(CAM)-assisted circuit. Moreover, the Reconfigurable Sense Amplifier (RSA) is designed to optimize the speed of memory operations, thus improving the whole performance of the SRAM circuit. In the end, a Tanner EDA tool is used to execute the proposed CAM-assisted 9T SRAM design. The performance outcomes show that the proposed design yields 10 μA leakage current, which is comparatively smaller than the existing designs.

Authors

Publication Details

Published
2025-04-05
DOI
https://doi.org/10.1109/devic63749.2025.11012149
Citations
1
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
2.27
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article

Design of Low Power and High Speed CAM-assisted 9T SRAM cell on 14nm FinFET Technology

Rajesh Nema, Sudheer Kumar Matam
1 citations
VLSI and Analog Circuit Testing
2.27
article

Design of Low Power and High Speed CAM-assisted 9T SRAM cell on 14nm FinFET Technology

Rajesh Nema, Sudheer Kumar Matam
article en
1 citations

Abstract

One of the key considerations in the design of low power Very-large-scale integration (VLSI) circuits is leakage power dissipation, which is entirely responsible for the circuit's overall performance. Because of the leakage and power consumption, the battery's long-lasting components lose their functionality quickly and reduce the system performance. So, in this research, the Fin-shaped Field-Effect Transistor (FinFET) based 9T SRAM cell is intended for achieving low power consumption and leakage current to speed up the write operations with the Content Addressable Memory(CAM)-assisted circuit. Moreover, the Reconfigurable Sense Amplifier (RSA) is designed to optimize the speed of memory operations, thus improving the whole performance of the SRAM circuit. In the end, a Tanner EDA tool is used to execute the proposed CAM-assisted 9T SRAM design. The performance outcomes show that the proposed design yields 10 μA leakage current, which is comparatively smaller than the existing designs.

Affordable and clean energy
Openalex Percentile: Top 15%
VLSI and Analog Circuit Testing
2.27
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