Full-Array Boolean Logic CIM Macro With Self-Recycling 10T-SRAM Cell for AES Systems

Computing in memory (CIM), which alleviates the need to transfer a large amount of data between processor and memory, significantly reducing latency and energy consumption, is a promising new computing architecture for addressing the von Neumann bottleneck problem. This article proposes a CIM array structure composed of self-recycling 10T static random access memory (SRAM) cells, which can realize orthogonal data writing, and multiple Boolean logical operations for the entire array. The self-recycling and full-array activation characteristics are extremely suitable for accelerating diverse data processing algorithms such as the Advanced Encryption Standard (AES). A 4-kb SRAM is implemented in 55-nm CMOS technology to verify the effectiveness of the design. Compared with other state-of-the-art architectures, the throughput and the operating frequency of the proposed CIM macro are increased to 843 GOPS/kb (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.64\times $</tex-math> </inline-formula>) and 823.7 MHz (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.6\times $</tex-math> </inline-formula>), respectively. The energy efficiency reaches 246.9 TOPS/W. When applied to the AES, the energy consumption is 35.77% less than the digital CIM architecture that is not self-recycling.

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Publication Details

Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Published
2025-05-29
DOI
https://doi.org/10.1109/tvlsi.2025.3572140
Citations
2
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
4.54

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article

Full-Array Boolean Logic CIM Macro With Self-Recycling 10T-SRAM Cell for AES Systems

Ying Pan, Xiulong Wu, John Long, Zhiting Lin et al.
2 citations
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
VLSI and Analog Circuit Testing
4.54
article

Full-Array Boolean Logic CIM Macro With Self-Recycling 10T-SRAM Cell for AES Systems

Ying Pan, Xiulong Wu, John Long, Zhiting Lin, Chunyu Peng, Yongliang Zhou, Yang Lou, Qian Jin, Xin Li, Lintao Chen, Bang-Li Wu
article en
2 citations

Abstract

Computing in memory (CIM), which alleviates the need to transfer a large amount of data between processor and memory, significantly reducing latency and energy consumption, is a promising new computing architecture for addressing the von Neumann bottleneck problem. This article proposes a CIM array structure composed of self-recycling 10T static random access memory (SRAM) cells, which can realize orthogonal data writing, and multiple Boolean logical operations for the entire array. The self-recycling and full-array activation characteristics are extremely suitable for accelerating diverse data processing algorithms such as the Advanced Encryption Standard (AES). A 4-kb SRAM is implemented in 55-nm CMOS technology to verify the effectiveness of the design. Compared with other state-of-the-art architectures, the throughput and the operating frequency of the proposed CIM macro are increased to 843 GOPS/kb (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.64\times $</tex-math> </inline-formula>) and 823.7 MHz (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.6\times $</tex-math> </inline-formula>), respectively. The energy efficiency reaches 246.9 TOPS/W. When applied to the AES, the energy consumption is 35.77% less than the digital CIM architecture that is not self-recycling.

IEEE Transactions on Very Large Scale Integration (VLSI) SystemsVol. 33(8)
Anhui University (CN)
National Natural Science Foundation of China, Anhui Provincial Key Research and Development Plan, Science and Technology Program of Gansu Province
Openalex Percentile: Top 7%
VLSI and Analog Circuit Testing
4.54
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