Multilayer target PIXE spectral simulation (X,X) secondary fluorescence correction algorithm
The theory for calculation of PIXE secondary fluorescence cross-sections for conversion of primary X-rays in homogeneous and multilayered samples, as a function of the primary emission spot, is presented and used for simulation of PIXE spectra.
Authors
- M.A. Reis (ORCID: https://orcid.org/0000-0002-3011-1858)
Institutions
- Tecnia (PT)
- Instituto Superior de Educação e Ciências (PT)
Publication Details
- Journal
- Journal of Analytical Atomic Spectrometry
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d4ja00463a
- Citations
- 1
- Primary Topic
- X-ray Spectroscopy and Fluorescence Analysis
- Type
- article
- Field-Weighted Citation Impact
- 1.88
Funders
- Fundação para a Ciência e a Tecnologia