Integrating photodetection and neuromorphic vision in ALD-grown amorphous Ga<sub>2</sub>O<sub>3</sub> thin films via bias-voltage modulation

We demonstrate what we believe to be a new atomic layer deposition (ALD) process utilizing gallium chloride (GaCl<sub>3</sub>) and water vapor as complementary precursors for synthesizing high-quality Ga<sub>2</sub>O<sub>3</sub> thin films. The developed process enables the growth of ultrasmooth amorphous Ga<sub>2</sub>O<sub>3</sub> layers with sub-nanometer surface roughness and an ultrawide bandgap of 5.29 eV, ideal for deep-ultraviolet (DUV) photonic applications. Metal-semiconductor-metal (MSM) photodetectors employing the Au/Ga<sub>2</sub>O<sub>3</sub>/Au architecture achieve exceptional performance metrics, including an outstanding photocurrent ratio of 98.36 under 254 nm illumination and ultrafast response characteristics (0.23 s rise/0.25 s decay times). The devices exhibit unique bias-tunable dual-mode operation: low-voltage operation enables conventional fast-response photodetection, while high bias conditions induce persistent photoconductivity effects. This voltage-dependent reconfigurability allows effective emulation of neurobiological functions, particularly demonstrating paired-pulse facilitation and replicating sophisticated learning-forgetting-relearning cognitive processes. Our findings establish ALD-grown Ga<sub>2</sub>O<sub>3</sub> as a versatile platform for developing multifunctional optoelectronic systems that synergistically integrate high-performance DUV detection with neuromorphic computing capabilities, paving the way for next-generation reconfigurable optical memory devices and bio-inspired visual processing architectures.

Authors

Publication Details

Journal
Optics Express
Published
2025-05-28
DOI
https://doi.org/10.1364/oe.564628
Citations
2
Primary Topic
Ga2O3 and related materials
Type
article
Field-Weighted Citation Impact
0.85

Funders

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article

Integrating photodetection and neuromorphic vision in ALD-grown amorphous Ga2O3 thin films via bias-voltage modulation

Liyong Jiang, Zichen Qi, Yanqiang Cao, Shuangting An
2 citations
Optics Express
Ga2O3 and related materials
0.85
article

Integrating photodetection and neuromorphic vision in ALD-grown amorphous Ga2O3 thin films via bias-voltage modulation

Liyong Jiang, Zichen Qi, Yanqiang Cao, Shuangting An
article en
2 citations

Abstract

We demonstrate what we believe to be a new atomic layer deposition (ALD) process utilizing gallium chloride (GaCl<sub>3</sub>) and water vapor as complementary precursors for synthesizing high-quality Ga<sub>2</sub>O<sub>3</sub> thin films. The developed process enables the growth of ultrasmooth amorphous Ga<sub>2</sub>O<sub>3</sub> layers with sub-nanometer surface roughness and an ultrawide bandgap of 5.29 eV, ideal for deep-ultraviolet (DUV) photonic applications. Metal-semiconductor-metal (MSM) photodetectors employing the Au/Ga<sub>2</sub>O<sub>3</sub>/Au architecture achieve exceptional performance metrics, including an outstanding photocurrent ratio of 98.36 under 254 nm illumination and ultrafast response characteristics (0.23 s rise/0.25 s decay times). The devices exhibit unique bias-tunable dual-mode operation: low-voltage operation enables conventional fast-response photodetection, while high bias conditions induce persistent photoconductivity effects. This voltage-dependent reconfigurability allows effective emulation of neurobiological functions, particularly demonstrating paired-pulse facilitation and replicating sophisticated learning-forgetting-relearning cognitive processes. Our findings establish ALD-grown Ga<sub>2</sub>O<sub>3</sub> as a versatile platform for developing multifunctional optoelectronic systems that synergistically integrate high-performance DUV detection with neuromorphic computing capabilities, paving the way for next-generation reconfigurable optical memory devices and bio-inspired visual processing architectures.

Optics ExpressVol. 33(12)
Fundamental Research Funds for the Central Universities
Openalex Percentile: Top 28%
Ga2O3 and related materials
0.85
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