Toward Reconfigurable In-Pixel Computing: A Fault-Tolerant Design Flow for Machine Learning Accelerators: (Invited Paper)

In-pixel computing has emerged as a promising paradigm for edge machine learning, enabling computations directly within sensors to achieve low latency and real-time performance. However, current hardware designs generated by high-level synthesis (HLS) tools often lack flexibility and adaptability to new tasks. Additionally, robustness against single-event upsets (SEUs) in harsh radiation environments remains a critical requirement. To overcome these limitations, we propose a fault-tolerant framework that evaluates bit-level susceptibility of neural network weights, selectively applying Triple Modular Redundancy (TMR) to critical components. Our methodology integrates custom memory modules into the HLS workflow, enabling post-deployment reconfiguration for task updates and adaptive fault protection. Moreover, we introduce a TMR-aware back-end synthesis flow that dynamically allocates redundancy according to user-defined area and power constraints, achieving scalable and efficient hardware implementations.

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Publication Details

Published
2025-05-04
DOI
https://doi.org/10.1109/fccm62733.2025.00014
Primary Topic
CCD and CMOS Imaging Sensors
Type
article
Field-Weighted Citation Impact
0.00

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article

Toward Reconfigurable In-Pixel Computing: A Fault-Tolerant Design Flow for Machine Learning Accelerators: (Invited Paper)

Manuel Blanco Valentín, Seda Ogrenci, Xiuyuan He, Honglian Guo
CCD and CMOS Imaging Sensors
article

Toward Reconfigurable In-Pixel Computing: A Fault-Tolerant Design Flow for Machine Learning Accelerators: (Invited Paper)

Manuel Blanco Valentín, Seda Ogrenci, Xiuyuan He, Honglian Guo
article en

Abstract

In-pixel computing has emerged as a promising paradigm for edge machine learning, enabling computations directly within sensors to achieve low latency and real-time performance. However, current hardware designs generated by high-level synthesis (HLS) tools often lack flexibility and adaptability to new tasks. Additionally, robustness against single-event upsets (SEUs) in harsh radiation environments remains a critical requirement. To overcome these limitations, we propose a fault-tolerant framework that evaluates bit-level susceptibility of neural network weights, selectively applying Triple Modular Redundancy (TMR) to critical components. Our methodology integrates custom memory modules into the HLS workflow, enabling post-deployment reconfiguration for task updates and adaptive fault protection. Moreover, we introduce a TMR-aware back-end synthesis flow that dynamically allocates redundancy according to user-defined area and power constraints, achieving scalable and efficient hardware implementations.

Northwestern University (US), McCormick (United States) (US)
National Science Foundation
Openalex Percentile: Top 90%
CCD and CMOS Imaging Sensors
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