A 302.5-GHz 30.9-dB-Gain THz Amplifier in 65-nm CMOS

A 302.5-GHz high-gain CMOS THz amplifier is proposed in this work. An electromagnetic (EM) modeling approach, verified by transistor measurements, is employed to optimize transistor layout, effectively reducing gate resistance and drain-to-gate capacitance. This significantly enhances the transistors maximum oscillation frequency fmax from 239.7 to 367.5 GHz. Furthermore, a Gmax-peak-offset-matching technique is proposed to simultaneously optimize active transistors and passive matching networks, significantly increasing the gain by 3.5 dB. Implemented in a 65-nm CMOS technology, the proposed THz amplifier achieves a measured gain of 30.9 dB at 302.5 GHz with an output saturation power of -5.3 dBm while only consuming 35.4 mW from a 1.1 V supply. To the best of the authors knowledge, this work exhibits the first experimental validation of the EM modeling approach and achieves the highest reported gain above 200 GHz in bulk CMOS technologies.

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Publication Details

Journal
IEEE Solid-State Circuits Letters
Published
2025-01-01
DOI
https://doi.org/10.1109/lssc.2025.3574413
Citations
1
Primary Topic
Radio Frequency Integrated Circuit Design
Type
article
Field-Weighted Citation Impact
0.73

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article

A 302.5-GHz 30.9-dB-Gain THz Amplifier in 65-nm CMOS

Chun-Hsing Li, Yi‐Fan Tseng, Yukai Chen, Wei-Zhe Su
1 citations
IEEE Solid-State Circuits Letters
Radio Frequency Integrated Circuit Design
0.73
article

A 302.5-GHz 30.9-dB-Gain THz Amplifier in 65-nm CMOS

Chun-Hsing Li, Yi‐Fan Tseng, Yukai Chen, Wei-Zhe Su
article en
1 citations

Abstract

A 302.5-GHz high-gain CMOS THz amplifier is proposed in this work. An electromagnetic (EM) modeling approach, verified by transistor measurements, is employed to optimize transistor layout, effectively reducing gate resistance and drain-to-gate capacitance. This significantly enhances the transistors maximum oscillation frequency fmax from 239.7 to 367.5 GHz. Furthermore, a Gmax-peak-offset-matching technique is proposed to simultaneously optimize active transistors and passive matching networks, significantly increasing the gain by 3.5 dB. Implemented in a 65-nm CMOS technology, the proposed THz amplifier achieves a measured gain of 30.9 dB at 302.5 GHz with an output saturation power of -5.3 dBm while only consuming 35.4 mW from a 1.1 V supply. To the best of the authors knowledge, this work exhibits the first experimental validation of the EM modeling approach and achieves the highest reported gain above 200 GHz in bulk CMOS technologies.

IEEE Solid-State Circuits LettersVol. 8
National Taiwan University (TW)
National Taiwan University, National Science and Technology Council
Affordable and clean energy
Openalex Percentile: Top 28%
Radio Frequency Integrated Circuit Design
0.73
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A 302.5-GHz 30.9-dB-Gain THz Amplifier in 65-nm CMOS — Chun-Hsing Li, Yi‐Fan Tseng, et al. · IEEE Solid-State Circuits Letters (2025) | TGRS Research Map | TGRS