M/MoS<sub>2</sub> (M = Ti, Al, Mo, Ag) Nanofilms: Preparation by Magnetron Sputtering and Effects of Power of Magnetron Sputtering and Medium/Low-Temperature Annealing

Molybdenum disulfide (MoS<sub>2</sub>) has been widely applied in photocatalysts, field-effect transistors (FETs), and solar cells in virtue of its high specific surface area and superior carrier mobility. Nevertheless, conventional MoS<sub>2</sub>-based FETs involve Au and Ag as the electrode materials, resulting in a high manufacturing cost. More importantly, conventional preparation methods (e.g., chemical vapor deposition) require a high-temperature process and transfer of MoS<sub>2</sub>, as well as subsequent electrode deposition, for device fabrication, while transfer of MoS<sub>2</sub> tends to cause secondary contamination. In this study, M/MoS<sub>2</sub> (M = Al, Ti, Mo, Ag) nanofilms were prepared by magnetron sputtering at room temperature. Herein, cost-effective electrode metals were used as the electrodes, and the transfer of MoS<sub>2</sub> is avoided. Meanwhile, the effects of key factors, including the power of magnetron sputtering and postsputtering annealing, on the electrical performance of as-prepared M/MoS<sub>2</sub> nanofilms were explored. The results demonstrated that the power of magnetron sputtering and medium- and low-temperature annealing significantly affected film morphology (e.g., particle size and surface roughness) and structure (e.g., crystallinity and structural integrity). Specifically, the resistivities of metal-semiconductor contacts of M/MoS<sub>2</sub> increased and then decreased as the power of magnetron sputtering increased; medium/low-temperature annealing led to decreased electrical resistivity at the metal-semiconductor contact of M/MoS<sub>2</sub>. Additionally, the M metal had a significant influence on the electrical performance of M/MoS<sub>2</sub>. Among the as-prepared composites, Mo/MoS<sub>2</sub> exhibited the lowest contact resistance, making Mo most suitable for the electrode in MoS<sub>2</sub>-based electronic devices. This study provides insights for the preparation of large-area M/MoS<sub>2</sub> nanofilms with improved electrical performances by cost-effective magnetron sputtering.

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Publication Details

Journal
Langmuir
Published
2025-05-27
DOI
https://doi.org/10.1021/acs.langmuir.5c01406
Citations
3
Primary Topic
2D Materials and Applications
Type
article
Field-Weighted Citation Impact
1.55

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article

M/MoS2 (M = Ti, Al, Mo, Ag) Nanofilms: Preparation by Magnetron Sputtering and Effects of Power of Magnetron Sputtering and Medium/Low-Temperature Annealing

Hu Chen, Jianquan Sang, Songtao Cai, Fen Xiong et al.
3 citations
Langmuir
2D Materials and Applications
1.55
article

M/MoS2 (M = Ti, Al, Mo, Ag) Nanofilms: Preparation by Magnetron Sputtering and Effects of Power of Magnetron Sputtering and Medium/Low-Temperature Annealing

Hu Chen, Jianquan Sang, Songtao Cai, Fen Xiong, Jianping Huang, Juangang Zhao, Jiwei Chen, Chunquan Liu, Fang He, Jun Wu, Xin He, Siyu Jiang
article en
3 citations

Abstract

Molybdenum disulfide (MoS<sub>2</sub>) has been widely applied in photocatalysts, field-effect transistors (FETs), and solar cells in virtue of its high specific surface area and superior carrier mobility. Nevertheless, conventional MoS<sub>2</sub>-based FETs involve Au and Ag as the electrode materials, resulting in a high manufacturing cost. More importantly, conventional preparation methods (e.g., chemical vapor deposition) require a high-temperature process and transfer of MoS<sub>2</sub>, as well as subsequent electrode deposition, for device fabrication, while transfer of MoS<sub>2</sub> tends to cause secondary contamination. In this study, M/MoS<sub>2</sub> (M = Al, Ti, Mo, Ag) nanofilms were prepared by magnetron sputtering at room temperature. Herein, cost-effective electrode metals were used as the electrodes, and the transfer of MoS<sub>2</sub> is avoided. Meanwhile, the effects of key factors, including the power of magnetron sputtering and postsputtering annealing, on the electrical performance of as-prepared M/MoS<sub>2</sub> nanofilms were explored. The results demonstrated that the power of magnetron sputtering and medium- and low-temperature annealing significantly affected film morphology (e.g., particle size and surface roughness) and structure (e.g., crystallinity and structural integrity). Specifically, the resistivities of metal-semiconductor contacts of M/MoS<sub>2</sub> increased and then decreased as the power of magnetron sputtering increased; medium/low-temperature annealing led to decreased electrical resistivity at the metal-semiconductor contact of M/MoS<sub>2</sub>. Additionally, the M metal had a significant influence on the electrical performance of M/MoS<sub>2</sub>. Among the as-prepared composites, Mo/MoS<sub>2</sub> exhibited the lowest contact resistance, making Mo most suitable for the electrode in MoS<sub>2</sub>-based electronic devices. This study provides insights for the preparation of large-area M/MoS<sub>2</sub> nanofilms with improved electrical performances by cost-effective magnetron sputtering.

LangmuirVol. 41(22)
Wuhan University of Science and Technology (CN), Hunan Institute of Technology (CN)
Hunan University, Natural Science Foundation of Hunan Province
Openalex Percentile: Top 18%
2D Materials and Applications
1.55
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