Three-terminal silicon field emitter arrays with integrated anodes

Three-terminal microscale silicon vacuum field emitter arrays with all-around grid structures and integrated anodes are presented. Instead of controlling individual field emitters, a group of emitter tips is gated together in a sub-array design, achieving low-cost batch fabrication in a CMOS-compatible process. Numerical simulations optimize the sub-array structure, while fabrication and three-dimensional integration are accomplished through a combination of electron-beam and optical lithography, dry etching, and wafer bonding techniques. Two device types with identical emitter tips (22.5k) are implemented with 5 × 5 and 2 × 2 sub-arrays. While the 5 × 5 sub-array vacuum triode achieves a higher maximum current density, the 2 × 2 sub-array device offers superior anode current [IA,max = 225 μA (10 nA/tip)], turn-on voltage (112 V), grid control of the emission current (maximum transconductance gm = 8.1 μS), and anode field intensification factor (γ = 87). With the transition to a CMOS platform, these devices demonstrate enhanced control over leakage currents, making them ideally suited for high-radiation environments such as space. Furthermore, they are primed for future high-frequency electronics, with expected performance reaching hundreds of MHz.

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Publication Details

Journal
AIP Advances
Published
2025-05-01
DOI
https://doi.org/10.1063/5.0270038
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
Field-Weighted Citation Impact
0.00

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article

Three-terminal silicon field emitter arrays with integrated anodes

Shabnam Ghotbi, Saeed Mohammadi
AIP Advances
Advancements in Semiconductor Devices and Circuit Design
article

Three-terminal silicon field emitter arrays with integrated anodes

Shabnam Ghotbi, Saeed Mohammadi
article en

Abstract

Three-terminal microscale silicon vacuum field emitter arrays with all-around grid structures and integrated anodes are presented. Instead of controlling individual field emitters, a group of emitter tips is gated together in a sub-array design, achieving low-cost batch fabrication in a CMOS-compatible process. Numerical simulations optimize the sub-array structure, while fabrication and three-dimensional integration are accomplished through a combination of electron-beam and optical lithography, dry etching, and wafer bonding techniques. Two device types with identical emitter tips (22.5k) are implemented with 5 × 5 and 2 × 2 sub-arrays. While the 5 × 5 sub-array vacuum triode achieves a higher maximum current density, the 2 × 2 sub-array device offers superior anode current [IA,max = 225 μA (10 nA/tip)], turn-on voltage (112 V), grid control of the emission current (maximum transconductance gm = 8.1 μS), and anode field intensification factor (γ = 87). With the transition to a CMOS platform, these devices demonstrate enhanced control over leakage currents, making them ideally suited for high-radiation environments such as space. Furthermore, they are primed for future high-frequency electronics, with expected performance reaching hundreds of MHz.

AIP AdvancesVol. 15(5)
Purdue University West Lafayette (US)
Air Force Office of Scientific Research
Openalex Percentile: Top 90%
Advancements in Semiconductor Devices and Circuit Design
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