Revolutionizing Analysis Approach Through Strategic Application of t-Tests: A Case Study in Semiconductor Manufacturing

The explosive growth in data volumes due to a paradigm shift in manufacturing and engineering processes by the advent of industry 4.0 has made it impossible for an engineer to examine all investigation outcomes with manual labour alone. This technological revolution necessitates a concomitant evolution in our analytical methodologies to effectively address the increased complexity, volume, and velocity of data generation. In this work, using Sort Parametric analyses as a case study, we demonstrate the strategic application of statistical methods in product engineering, offering insights into the practical implementation of t-tests/ Anova as a powerful and effective tool for screening big data analyses to enhance efficiency in our data-driven decision-making cycles, aiding in process optimization and anomaly detections.