High-Reliability IoT SRAM Architecture Using Nwise and Pwise Cells for Space Applications
SRAM cells play a critical role in memory components such as caches, register files, and translation lookaside buffers, with their design needing to meet specific requirements based on their intended use. In the aerospace sector, where power efficiency and reliability are paramount due to constrained power resources and exposure to high radiation, the Nwise cell, designed with 28nm FD-SOI technology, addresses these challenges by providing strong reliability and resistance to radiation. This research also presents the Pwise cell, a novel design derived from the Nwise cell and utilizing the same 28nm FD-SOI technology. Simulations indicate that both the Nwise and Pwise cells offer excellent protection against single-event upsets (SEUs) and multiple-event upsets (MEUs) in space environments. The Pwise cell, with its lower read and write latencies, is well-suited for log file applications, while the Nwise cell, with lower read latency and reduced power consumption, is ideal for cache memory designs. Both cells present promising options for space-grade memory systems.
Publication Details
- Journal
- Journal on Electronic and Automation Engineering
- Published
- 2025-05-26
- DOI
- https://doi.org/10.46632/jeae/4/2/27
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00