Automated Detection of Micro-Scale Porosity Defects in Reflective Metal Parts via Deep Learning and Polarization Imaging
Aiming at the key technology of defect detection in precision additive manufacturing of highly reflective metal materials, this study proposes an enhanced SCK-YOLOV5 framework, which combines polarization imaging and deep learning methods to significantly improve the intelligent identification ability of small metal micro and nano defects. This framework introduces the SNWD (Selective Network with attention for Defect and Weathering Degradation) Loss function, which combines the SIOU Angle Loss with the NWD distribution sensing characteristics. It is specially designed for automatic positioning and identification of micrometer hole defects. At the same time, we employ global space construction with a dual-attention mechanism and multi-scale feature refining technique with selection kernel convolution to extract multi-scale defect information from highly reflective surfaces stably. Combined with the polarization imaging preprocessing and the comparison of enhancement defects under high reflectivity, the experimental results show that the proposed method significantly improves the precision, recall rate, and <i>mAP</i>50 index compared with the YOLOv5 baseline (increased by 0.5%, 1.2%, and 1.8%, respectively). It is the first time that this improvement has been achieved among the existing methods based on the YOLO framework. It creates a new paradigm for intelligent defect detection in additive manufacturing of high-precision metal materials and provides more reliable technical support for quality control in industrial manufacturing.
Authors
- Shucheng Li (ORCID: https://orcid.org/0000-0002-5414-6203)
- Xing Peng (ORCID: https://orcid.org/0000-0002-6177-3715)
- Xia Yu (ORCID: https://orcid.org/0000-0001-6983-1847)
- Bo Wang (ORCID: https://orcid.org/0000-0002-3973-9377)
- Shiqing Li (ORCID: https://orcid.org/0000-0001-9883-4553)
- Feng Shi
- Haozhe Li (ORCID: https://orcid.org/0000-0003-2295-0448)
- Chong Shan
Institutions
- National University of Defense Technology (CN)
- Chinese Academy of Sciences (CN)
- Shanghai Institute of Ceramics (CN)
- Zhejiang University of Technology (CN)
Publication Details
- Journal
- Nanomaterials
- Published
- 2025-05-25
- DOI
- https://doi.org/10.3390/nano15110795
- Citations
- 1
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 1.24
Funders
- National Natural Science Foundation of China
- China Postdoctoral Science Foundation
- Natural Science Foundation of Hunan Province