Testing Without Breaking

Nondestructive testing is a key tool for test engineers examining the quality and performance of parts and materials in aerospace

Authors

Publication Details

Journal
Aerospace Testing International
Published
2025-03-01
DOI
https://doi.org/10.12968/s1478-2774(25)50077-7
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Testing Without Breaking

Abigail Williams
Aerospace Testing International
VLSI and Analog Circuit Testing
article

Testing Without Breaking

Abigail Williams
article en

Abstract

Nondestructive testing is a key tool for test engineers examining the quality and performance of parts and materials in aerospace

Aerospace Testing InternationalVol. 2025(1)
Openalex Percentile: Top 90%
VLSI and Analog Circuit Testing
DOISourceOpenAlex
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Testing Without Breaking — Abigail Williams · Aerospace Testing International (2025) | TGRS Research Map | TGRS