Multioutput Convolutional Neural Network for Improved Parameter Extraction in Time-Resolved Electrostatic Force Microscopy Data

Time-resolved scanning probe microscopy methods, like time-resolved electrostatic force microscopy (trEFM), enable imaging of dynamic processes ranging from ion motion in batteries to electronic dynamics in microstructured thin film semiconductors for solar cells. Reconstructing the underlying physical dynamics from these techniques can be challenging due to the interplay of cantilever physics with the actual transient kinetics of interest in the resulting signal. Previously, quantitative trEFM used empirical calibration of the cantilever or feed-forward neural networks trained on simulated data to extract the physical dynamics of interest. Both these approaches are limited by interpreting the underlying signal as a single exponential function, which serves as an approximation but does not adequately reflect many realistic systems. Here, we present a multibranched, multioutput convolutional neural network (CNN) that uses the trEFM signal in addition to the physical cantilever parameters as input. The trained CNN accurately extracts parameters describing both single-exponential and biexponential underlying functions and more accurately reconstructs real experimental data in the presence of noise. This work demonstrates an application of physics-informed machine learning to complex signal processing tasks, enabling more efficient and accurate analysis of trEFM.

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Publication Details

Journal
Journal of Chemical Information and Modeling
Published
2025-05-23
DOI
https://doi.org/10.1021/acs.jcim.5c00267
Citations
1
Primary Topic
Force Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
1.25

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article

Multioutput Convolutional Neural Network for Improved Parameter Extraction in Time-Resolved Electrostatic Force Microscopy Data

Rajiv Giridharagopal, David S. Ginger, Madeleine Breshears
1 citations
Journal of Chemical Information and Modeling
Force Microscopy Techniques and Applications
1.25
article

Multioutput Convolutional Neural Network for Improved Parameter Extraction in Time-Resolved Electrostatic Force Microscopy Data

Rajiv Giridharagopal, David S. Ginger, Madeleine Breshears
article en
1 citations

Abstract

Time-resolved scanning probe microscopy methods, like time-resolved electrostatic force microscopy (trEFM), enable imaging of dynamic processes ranging from ion motion in batteries to electronic dynamics in microstructured thin film semiconductors for solar cells. Reconstructing the underlying physical dynamics from these techniques can be challenging due to the interplay of cantilever physics with the actual transient kinetics of interest in the resulting signal. Previously, quantitative trEFM used empirical calibration of the cantilever or feed-forward neural networks trained on simulated data to extract the physical dynamics of interest. Both these approaches are limited by interpreting the underlying signal as a single exponential function, which serves as an approximation but does not adequately reflect many realistic systems. Here, we present a multibranched, multioutput convolutional neural network (CNN) that uses the trEFM signal in addition to the physical cantilever parameters as input. The trained CNN accurately extracts parameters describing both single-exponential and biexponential underlying functions and more accurately reconstructs real experimental data in the presence of noise. This work demonstrates an application of physics-informed machine learning to complex signal processing tasks, enabling more efficient and accurate analysis of trEFM.

Journal of Chemical Information and ModelingVol. 65(11)
University of Washington (US)
Basic Energy Sciences
Affordable and clean energy
Openalex Percentile: Top 21%
Force Microscopy Techniques and Applications
1.25
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Multioutput Convolutional Neural Network for Improved Parameter Extraction in Time-Resolved Electrostatic Force Microscopy Data — Rajiv Giridharagopal, David S. Ginger, et al. · Journal of Chemical Information and Modeling (2025) | TGRS Research Map | TGRS