Certainty From Uncertainty: Multigranularity Labeling Inspired by Quantum Collapse for Learning With Noisy Labels in Fault Diagnosis

Deep learning has demonstrated exceptional performance in fault diagnosis tasks that rely on large-scale datasets. However, the high cost of annotating such datasets has led to the emergence of various automatic annotation methods. While these methods reduce labeling costs, they inevitably introduce noisy labels, which pose significant challenges to the generalization and accuracy of deep learning-based diagnostic models. Although Learning with Noisy Labels (LNL) methods mitigate the adverse effects of noisy labels through strategies such as sample separation or label correction, many rely heavily on their own prediction results to guide subsequent training, which often introduces confirmation bias, limiting the effectiveness of the trained models. To address this limitation, this article draws inspiration from quantum collapse and proposes a novel LNL strategy named Multigranularity Labeling (MgL). By integrating observed labels, pseudolabels, and collapsed labels, MgL constructs the multigranularity labels, designed to suppress confirmation bias and improve the model's tolerance to noisy labels. Extensive experiments validate the effectiveness and superiority of MgL, particularly on training datasets with high noise intensity, such as those with 90% symmetric noise. This advancement offers promising opportunities for applying datasets with lower annotation costs in real-world scenarios, ultimately contributing to intelligent diagnostic systems.

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Publication Details

Journal
IEEE Transactions on Industrial Informatics
Published
2025-05-22
DOI
https://doi.org/10.1109/tii.2025.3567264
Citations
4
Primary Topic
Advanced Statistical Process Monitoring
Type
article
Field-Weighted Citation Impact
5.59

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article

Certainty From Uncertainty: Multigranularity Labeling Inspired by Quantum Collapse for Learning With Noisy Labels in Fault Diagnosis

Xinde Li, Fir Dunkin, Guoliang Wu, Kui Wang et al.
4 citations
IEEE Transactions on Industrial Informatics
Advanced Statistical Process Monitoring
5.59
article

Certainty From Uncertainty: Multigranularity Labeling Inspired by Quantum Collapse for Learning With Noisy Labels in Fault Diagnosis

Xinde Li, Fir Dunkin, Guoliang Wu, Kui Wang, Zhijun Li, Zhentong Zhang, Tianrong Gao
article en
4 citations

Abstract

Deep learning has demonstrated exceptional performance in fault diagnosis tasks that rely on large-scale datasets. However, the high cost of annotating such datasets has led to the emergence of various automatic annotation methods. While these methods reduce labeling costs, they inevitably introduce noisy labels, which pose significant challenges to the generalization and accuracy of deep learning-based diagnostic models. Although Learning with Noisy Labels (LNL) methods mitigate the adverse effects of noisy labels through strategies such as sample separation or label correction, many rely heavily on their own prediction results to guide subsequent training, which often introduces confirmation bias, limiting the effectiveness of the trained models. To address this limitation, this article draws inspiration from quantum collapse and proposes a novel LNL strategy named Multigranularity Labeling (MgL). By integrating observed labels, pseudolabels, and collapsed labels, MgL constructs the multigranularity labels, designed to suppress confirmation bias and improve the model's tolerance to noisy labels. Extensive experiments validate the effectiveness and superiority of MgL, particularly on training datasets with high noise intensity, such as those with 90% symmetric noise. This advancement offers promising opportunities for applying datasets with lower annotation costs in real-world scenarios, ultimately contributing to intelligent diagnostic systems.

IEEE Transactions on Industrial InformaticsVol. 21(8)
Tongji University (CN), Southeast University (CN)
National Natural Science Foundation of China
Climate action
Openalex Percentile: Top 4%
Advanced Statistical Process Monitoring
5.59
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