Three-Level Gate Drive for Crosstalk Suppression of GaN Devices With Low Reverse Conduction Loss
The crosstalk problem in gallium nitride (GaN) based bridge configuration limits the high-switching speed and high-frequency applications of GaN devices at high-voltage levels. A three-level gate drive for crosstalk suppression with low reverse conduction loss during both dead times at turn-on and turn-off is proposed in this article. The capacitor-NMOS circuit provides a low-impedance Miller current path to reduce the positive and negative crosstalk voltage amplitudes. Through a delay pulse module, negative gate-source voltage is accurately applied to suppress the positive crosstalk voltage peak and the GaN device is turned off in gate-source zero voltage during the dead time to reduce the reverse conduction loss. The value of the negative gate-source voltage depends on the Zener diode, which is flexible and adjustable. The proposed method, which is easy to control at a low cost, requires no additional driver IC and control signals. At the condition of 400 V and 200 V DC bus voltage, the double-pulse test based on GS66508B verifies the effectiveness of the proposed method for crosstalk suppression of GaN devices.
Authors
- Shuaiqing Zhi
- Dianguo Xu (ORCID: https://orcid.org/0000-0002-1594-8625)
- Lurenhang Wang (ORCID: https://orcid.org/0009-0005-5080-0289)
- Xiaoqing Cai (ORCID: https://orcid.org/0000-0002-8995-4518)
- Mingcheng Ma
- Yishun Yan
Institutions
- Harbin Institute of Technology (CN)
Publication Details
- Journal
- IEEE Transactions on Power Electronics
- Published
- 2025-05-22
- DOI
- https://doi.org/10.1109/tpel.2025.3572713
- Citations
- 1
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73